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Equipment

 

Stereomicroscope


A Zeiss Discovery 12 stereomicroscope with a digital camera and image capture system is used for macroscopic examination, documentation and measurement of components at magnification of X5 to X160.

Stereo Microscope
Scanning Electron Microscope

Scanning Electron Microscope


A Cambridge 360 Scanning Electron Microscope (SEM) with a digital image capture system is primarily used for high-magnification examination and documentation of fracture faces to
confirm or determine the fracture initiation location, fracture mode and the cause for the failure.  The magnification range of the SEM is from X10 to X300,000.
 

Energy Dispersive Spectrometer


A Quartz XOne energy dispersive spectrometric (EDS) analysis system with X-ray mapping capability is used for analyzing component materials, material defects, engine or gearbox chips, contaminants and corrosion products. 		Energy Dispursive Spectrometor plot
Hardness Tester

Hardness Testers


Standard Rockwell, superficial Rockwell and micro-hardness testers are used to check the hardness of materials as well as for such tasks as determining the depth of hardened cases, checking for decarburization of steels, etc.

Metallurgical Microscope


A Zeiss Axiovert 200  MAT metallurgical microscope is used to examine and document the microstructure of prepared samples of material and to check for possible defects in those samples at magnifications from X50 to X1600.  The microscope is equipped for brightfield, darkfield and differential contrast examination techniques.  

Metallurgical Microscope